產品說明NTT-AT's X-ray resolution evaluation charts are applied to several X-ray analysis situations which require ultra-high resolution, such as X-ray microscopes, X-ray micro-beam analysis, and X-ray imaging. This de facto standard X-ray chart is used in a very large number of situations throughout the world.
High X-ray irradiation durability, ultra-sharp pattern, and low edge roughness. These are the biggest features of NTT-AT's X-ray chart. Our SiC membrane based Ta absorber chart has proved to be outstandingly accurate and provides clear images for your X-ray analysis system evaluation.
Please try out the proven performance as the de facto standard.