產品說明NTT-AT's Fresnel Zone Plate (FZP), constructed from SiC membrane and Ta absorber pattern, has an outstandingly high X-ray irradiation durability, high resolution, and high contrast.
Only NTT-AT provides the SiC membrane-based Fresnel Zone Plate (FZP), which has an outstandingly high X-ray irradiation durability. NTT-AT's FZP is constructed from dry etched Ta. It has a sharp absorber pattern and achieves a high S/N ratio and low defect imaging, and is ideal for applications such as X-ray microscopes, X-ray micro-beam irradiation, and X-ray imaging.
In addition, the Ta pattern/SiN membrane-type FZP and Au plated pattern/SiN membrane-type FZP are provided for using in soft X-ray and extreme ultraviolet (EUV/XUV) regions. In addition, a Step (Kinoform) FZP is available.